More often than not, enterprise code is badly unit tested or worse, not unit tested. While the reasons for this could vary from time constraints, budget constraints or lack of developer knowledge, ...

My colleagues from Mentor Graphics, Ron Press, Martin Keim, and I often write about various aspects of digital IC test. If you started following the Test Voices blog when it was part of Test & ...

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...

In current system-on-a-chip (SoC) development, no standard access mechanism exists for testing embedded logic cores. Each core provider develops its own process for isolating the core and testing it.