The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

As semiconductor devices become increasingly complex, the challenge of testing them efficiently and accurately grows in parallel. Traditional testing methods—rooted in static test plans—often fall ...

The researchers in Keio University developed a novel tool path generation method for driving an independently controlled fast tool servo (FTS) for freeform surface machining. Without necessity of ...