Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in ...

Researchers developed a daylight electroluminescence imaging method that enables detection of low-energy glass cracks in PV ...

One of the challenges of cramming smarter and more powerful electronics into ever-shrinking devices is developing the tools and techniques to analyze the materials that make them up with increasingly ...

Sophisticated artificial intelligence tools are being used to inspect power lines in an era of transition and climate risk. A helicopter loaded with cameras and sensors sweeps over a utility’s ...

Researchers in China have developed a novel deep learning model to detect defects in photovoltaic panels. The approach leverages high-resolution visible light imaging to identify defects using an ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...